An analysis of power reduction techniques in scan testing
- 13 November 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 670-677
- https://doi.org/10.1109/test.2001.966687
Abstract
Power consumption during scan testing is becoming a concern. Circuit switching activity during scanshifting is high and results in high average and instantaneous power consumption. This paper presentsa scheme for reducing power and provides analysis results on an industrial design.Keywords
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