A low-temperature dynamic mode scanning force microscope operating in high magnetic fields
- 26 May 1999
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 70 (6), 2765-2768
- https://doi.org/10.1063/1.1149842
Abstract
A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip–sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.This publication has 13 references indexed in Scilit:
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