Piezoelectric shear force detection: A geometry avoiding critical tip/tuning fork gluing
- 1 April 1998
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 69 (4), 1744-1746
- https://doi.org/10.1063/1.1148835
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- A distance regulation scheme for scanning near-field optical microscopyApplied Physics Letters, 1996
- An easy-to-use non-optical shear-force distance control for near-field optical microscopesReview of Scientific Instruments, 1996
- Detection of probe dither motion in near-field scanning optical microscopyApplied Optics, 1995
- A nonoptical tip–sample distance control method for near-field scanning optical microscopy using impedance changes in an electromechanical systemReview of Scientific Instruments, 1995
- Piezoelectric tip-sample distance control for near field optical microscopesApplied Physics Letters, 1995
- Shear force microscopy with capacitance detection for near-field scanning optical microscopyApplied Physics Letters, 1995
- Minimum detectable displacement in near-field scanning optical microscopyApplied Physics Letters, 1994
- Near-field differential scanning optical microscope with atomic force regulationApplied Physics Letters, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- Collection mode near-field scanning optical microscopyApplied Physics Letters, 1987