Rankings
Publications
Sources
Publishers
Scholars
Organizations
About
Login
Register
Home
Publications
Cryogenic scanning probe characterization of semiconductor nanostructures
Home
Publications
Cryogenic scanning probe characterization of semiconductor nanostructures
Cryogenic scanning probe characterization of semiconductor nanostructures
ME
M. A. Eriksson
M. A. Eriksson
RB
R. G. Beck
R. G. Beck
MT
M. Topinka
M. Topinka
JK
J. A. Katine
J. A. Katine
R. M. Westervelt
R. M. Westervelt
KC
K. L. Campman
K. L. Campman
AG
A. C. Gossard
A. C. Gossard
Publisher Website
Google Scholar
Cite
Download
Share
Download
29 July 1996
journal article
Published by
AIP Publishing
in
Applied Physics Letters
Vol. 69
(5)
,
671-673
https://doi.org/10.1063/1.117801
Abstract
No abstract available
Keywords
SCANNING PROBE MICROSCOPE
ELECTRON TRANSPORT
TWO DIMENSIONAL ELECTRON GAS
SPATIAL RESOLUTION
GALLIUM ARSENIDE
Cited by 137 articles