Temperature dependent space-charge-limited currents in amorphous and disordered semiconductors
- 15 July 1996
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 80 (2), 880-888
- https://doi.org/10.1063/1.362897
Abstract
The temperature dependent space‐charge‐limited currents (SCLCs), manifested by the dependence of the apparent pre‐exponential factor of space‐charge‐limited (SCL) conductivity on the injection dependent activation energy, is examined. Starting from the exact theory of SCLC, the formula for the activation energy of SCL injection dependent conductivity was derived. The method of SCL currents seems to be a unique method to determine the true electrical conductivity pre‐exponential factor of the electrical conductivity. Systematic determination of the relation of the pre‐exponential factor of the conductivity on its activation energy during the measurements of voltage and temperature dependencies of SCL currents gives information on the reliability of the reconstruction of the density‐of‐electronic states.Keywords
This publication has 12 references indexed in Scilit:
- Tail-state distribution in the density of states of p-type a-Si:HPhilosophical Magazine Letters, 1991
- Meyer-neldel rule in undoped a-Si:H, examined by tm-sclc methodJournal of Non-Crystalline Solids, 1987
- The bulk trap spectroscopy of solids by temperature-modulated space-charge-limited currents (TMSCLC): Application to real crystalline and amorphous semiconductorsJournal of Physics C: Solid State Physics, 1986
- The effects of linear strain on the electronic properties of glow discharge amorphous siliconJournal of Non-Crystalline Solids, 1985
- The bulk trap spectroscopy of solids by temperature-modulated space-charge-limited currents (TMSCLC) in the steady stateJournal of Physics C: Solid State Physics, 1985
- Optical absorption of Mo-based alloysPhysical Review B, 1984
- The density of states in amorphous silicon determined by space-charge-limited current measurementsPhilosophical Magazine Part B, 1982
- Characterized of glow-discharge deposited a-Si:HSolar Energy Materials, 1980
- Use of space-charge-limited current measurements to determine the properties of energetic distributions of bulk trapsJournal of Applied Physics, 1980
- Study of Localized Levels in Semi-Insulators by Combined Measurements of Thermally Activated Ohmic and Space-Charge-Limited ConductionPhysical Review B, 1969