Abstract
A simple analytical method is put forward in this paper, enabling one to extract quantitative information about an arbitrary energetic distribution of traps for current carriers from a single experimental space‐charge‐limited current‐voltage characteristic. The applicability of the method is illustrated with computer‐simulated characteristics, calculated for various typical distributions of traps. The effect of the nonstability of the current, nonuniformity of the spatial distribution of traps, and temperature on the accuracy of the determination of the parameters of traps is briefly discussed.