A thorough investigation of MOSFETs NBTI degradation
- 1 January 2005
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 45 (1), 83-98
- https://doi.org/10.1016/j.microrel.2004.04.027
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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