Theory of channel hot-carrier degradation in MOSFETs

Publisher Website

1 December 1999

journal article
Published by Elsevier BV in Physica B: Condensed Matter

Vol. 272 (1-4), 527-531
https://doi.org/10.1016/s0921-4526(99)00363-4

Abstract

No abstract available

Keywords

Cited by 42 articles