A Dominating Error Region Strategy for Improving the Bit-Flipping LDPC Decoder of SSDs
- 27 February 2015
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Express Briefs
- Vol. 62 (6), 578-582
- https://doi.org/10.1109/tcsii.2015.2407732
Abstract
This brief presents a dominating error region strategy (DERS) that improves the bit-flipping (BF) low-density parity-check decoder for solid-state drives. With the help of the DERS, the state-of-the-art BF decoding algorithms achieve better error correction performance while taking less iterations. Specifically, the DERS provides solutions for restricting the occurrences of an even number of flipped bits and bit-error propagations, both of which are intrinsic problems to current BF decoding algorithms. The DERS can be implemented with a simple circuitry and serve as a fine-tuning technique for the decoding reliability-performance tradeoff. In this brief, the DERS is evaluated with numerical analysis and computer simulations.Keywords
Funding Information
- National Natural Science Foundation of China (61433019, U1435217, 61300218, 61300217, 61232003, 61472131, 61272546)
This publication has 9 references indexed in Scilit:
- Enhanced Precision Through Multiple Reads for LDPC Decoding in Flash MemoriesIEEE Journal on Selected Areas in Communications, 2014
- A Novel Bit-Flipping LDPC Decoder for Solid-State Data StorageApplied Mechanics and Materials, 2014
- Statistical Characterization of Noise and Interference in NAND Flash MemoryIEEE Transactions on Circuits and Systems I: Regular Papers, 2013
- Product Code Schemes for Error Correction in MLC NAND Flash MemoriesIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011
- Gradient descent bit flipping algorithms for decoding LDPC codesIEEE Transactions on Communications, 2010
- Using Data Postcompensation and Predistortion to Tolerate Cell-to-Cell Interference in MLC nand Flash MemoryIEEE Transactions on Circuits and Systems I: Regular Papers, 2010
- Improving Multi-Level NAND Flash Memory Storage Reliability Using Concatenated BCH-TCM CodingIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2009
- New insights into weighted bit-flipping decodingIEEE Transactions on Communications, 2009
- Towards Understanding Weighted Bit-Flipping DecodingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2007