High-resolution imaging of silicon (111) using a 100 keV STEM
Open Access
- 28 February 1990
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 32 (2), 93-102
- https://doi.org/10.1016/0304-3991(90)90027-j
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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