Simulation of annular dark field stem images using a modified multislice method
- 1 January 1987
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 23 (1), 77-96
- https://doi.org/10.1016/0304-3991(87)90229-4
Abstract
The multislice method of image simulation has been extensively applied to conventional transmission electron micrographs (CTEM), but not yet to scanning transmission electron micrographs (STEM). In this paper the multislice method is adapted for application to the STEM and several examples relevant to the VG-HB501 STEM are presented. Annular dark field images of a (111) crystal silicon substrate supporting a single heavy atom are calculated.Keywords
This publication has 28 references indexed in Scilit:
- Improved high resolution image processing of bright field electron micrographs: II. ExperimentUltramicroscopy, 1985
- Improved high resolution image processing of bright field electron micrographs: I. TheoryUltramicroscopy, 1984
- Computerized analytical electron microscope for elemental imagingReview of Scientific Instruments, 1984
- Digital acquisition and processing of electron micrographs using a scanning transmission electron microscopeUltramicroscopy, 1981
- Fast digital data acquisition and on-line processing system for an HB5 scanning transmission electron microscopeReview of Scientific Instruments, 1981
- Innovative imaging and microdiffraction in stemUltramicroscopy, 1978
- Approximations for dynamical calculations of microdiffraction patterns and images of defectsActa Crystallographica Section A, 1978
- A new theoretical and practical approach to the multislice methodActa Crystallographica Section A, 1977
- Numerical evaluations ofN-beam wave functions in electron scattering by the multi-slice methodActa Crystallographica Section A, 1974
- The scattering of electrons by atoms and crystals. I. A new theoretical approachActa Crystallographica, 1957