Single-event effects in avionics
- 1 April 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (2), 461-474
- https://doi.org/10.1109/23.490893
Abstract
The occurrence of single-event upset (SEU) in aircraft electronics has evolved from a series of interesting anecdotal incidents to accepted fact. A study completed in 1992 demonstrated that SEUs are real, that the measured in-flight rates correlate with the atmospheric neutron flux, and that the rates can be calculated using laboratory SEU data. Once avionics SEU was shown to be an actual effect, it had to be dealt with in avionics designs. The major concern is in random access memories (RAMs), both static (SRAMs) and dynamic (DRAMs), because these microelectronic devices contain the largest number of bits, but other parts, such as microprocessors, are also potentially susceptible to upset. In addition, other single-event effects (SEEs), specifically latch-up and burnout, can also be induced by atmospheric neutrons.Keywords
This publication has 38 references indexed in Scilit:
- Soft error rate and stored charge requirements in advanced high-density SRAMsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- The single event upset environment for avionics at high latitudeIEEE Transactions on Nuclear Science, 1994
- Single event upset in avionicsIEEE Transactions on Nuclear Science, 1993
- Rate prediction for single event effects-a critiqueIEEE Transactions on Nuclear Science, 1992
- Guidelines for predicting single-event upsets in neutron environments (RAM devices)IEEE Transactions on Nuclear Science, 1991
- Determination of SEU parameters of NMOS and CMOS SRAMsIEEE Transactions on Nuclear Science, 1991
- The Los Alamos National Laboratory Spallation Neutron SourcesNuclear Science and Engineering, 1990
- Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsetsIEEE Transactions on Nuclear Science, 1989
- An estimate of error rates in integrated circuits at aircraft altitudes and at sea levelNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- Effect of Cosmic Rays on Computer MemoriesScience, 1979