Simulation of scanning transmission electron microscope images on desktop computers
- 28 February 2010
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 110 (3), 195-198
- https://doi.org/10.1016/j.ultramic.2009.11.009
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyUltramicroscopy, 2009
- Quantitative Atomic Resolution Scanning Transmission Electron MicroscopyPhysical Review Letters, 2008
- Influence of the static atomic displacement on atomic resolution Z-contrast imagingPhysical Review B, 2008
- Atomic-resolution quantitative composition analysis using scanning transmission electron microscopy Z-contrast experimentsPhysical Review B, 2005
- Atomic-resolution annular dark-field STEM image calculationsPhysical Review B, 2001
- An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imagingUltramicroscopy, 1997
- Incoherent imaging of zone axis crystals with ADF STEMUltramicroscopy, 1992
- Simulation of annular dark field stem images using a modified multislice methodUltramicroscopy, 1987
- A new theoretical and practical approach to the multislice methodActa Crystallographica Section A, 1977
- Numerical evaluations ofN-beam wave functions in electron scattering by the multi-slice methodActa Crystallographica Section A, 1974