Predictive error detection by on-line aging monitoring
- 1 July 2010
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
The purpose of this paper is to present a predictive error detection methodology, based on monitoring of long-term performance degradation of semiconductor systems. Delay variation is used to sense timing degradation due to aging (namely, due to NBTI), or to physical defects activated by long lifetime operation, which may occur in safety-critical systems (automotive, health, space). Error is prevented by detecting critical paths abnormal (but not fatal) propagation delays. A monitoring procedure and a programmable aging sensor are proposed. The sensor is selectively inserted in key locations in the design and can be activated either on user's requirement, or at pre-defined situations (e.g., at power-up). The sensor is optimized to exhibit low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Sensor limitations are analysed. A new sensor architecture and a sensor insertion algorithm are proposed. Simulation results are presented with a ST 65 nm sensor design.Keywords
This publication has 16 references indexed in Scilit:
- Programmable aging sensor for automotive safety-critical applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2010
- Built-in aging monitoring for safety-critical applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2009
- Adaptive techniques for overcoming performance degradation due to aging in digital circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2009
- Optimized Circuit Failure Prediction for Aging: Practicality and PromisePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2008
- NBTI resilient circuits using adaptive body biasingPublished by Association for Computing Machinery (ACM) ,2008
- Implementation of MOSFET based capacitors for digital applicationsPublished by Association for Computing Machinery (ACM) ,2006
- Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Reversal of temperature dependence of integrated circuits operating at very low voltagesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus linesIEEE Transactions on Computers, 2000
- Supply voltage scaling for temperature insensitive CMOS circuit operationIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 1998