GaN HEMT reliability
- 1 September 2009
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 49 (9-11), 1200-1206
- https://doi.org/10.1016/j.microrel.2009.07.003
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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