Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs
- 1 July 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 37 (7), 1651-1657
- https://doi.org/10.1109/16.55752
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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