Effects of zirconium doping on the characteristics of tin oxide thin film transistors
- 27 July 2013
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 53 (12), 1875-1878
- https://doi.org/10.1016/j.microrel.2013.07.001
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Science and Technology (2012-3001641)
- National Research Foundation of Korea
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