Two methods of tuning threshold voltage of bulk FinFETs with replacement high-k metal-gate stacks
- 1 March 2017
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 129, 52-60
- https://doi.org/10.1016/j.sse.2016.12.016
Abstract
No abstract availableFunding Information
- Basic Technology Research (2013ZX02303-007)
- China National Young Scientists Fund (61604173)
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