Electrical characterization of 4H–SiC Schottky diodes with a RuO2 and a RuWO x Schottky contacts
- 4 October 2007
- journal article
- Published by Springer Science and Business Media LLC in Journal of Materials Science: Materials in Electronics
- Vol. 19 (8-9), 783-787
- https://doi.org/10.1007/s10854-007-9409-z
Abstract
No abstract availableKeywords
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