Model-based feedback controller design for dual actuated atomic force microscopy
- 30 April 2012
- journal article
- Published by Elsevier BV in Mechatronics
- Vol. 22 (3), 327-337
- https://doi.org/10.1016/j.mechatronics.2011.08.003
Abstract
No abstract availableKeywords
This publication has 34 references indexed in Scilit:
- Simultaneous sensing and actuation with a piezoelectric tube scannerReview of Scientific Instruments, 2008
- A Survey of Control Issues in NanopositioningIEEE Transactions on Control Systems Technology, 2007
- Design and Modeling of a High-Speed AFM-ScannerIEEE Transactions on Control Systems Technology, 2007
- A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force MicroscopesAmerican Control Conference (ACC), 2007
- High-Speed Atomic Force MicroscopyScience, 2006
- Design methodologies for robust nano-positioningIEEE Transactions on Control Systems Technology, 2005
- A high-speed atomic force microscope for studying biological macromoleculesProceedings of the National Academy of Sciences of the United States of America, 2001
- Vibration compensation for high speed scanning tunneling microscopyReview of Scientific Instruments, 1999
- An atomic-resolution atomic-force microscope implemented using an optical leverJournal of Applied Physics, 1989
- Atomic Force MicroscopePhysical Review Letters, 1986