An all-digital self-calibrated delay-line based temperature sensor for VLSI thermal sensing and management
- 1 September 2015
- journal article
- Published by Elsevier BV in Integration
- Vol. 51, 107-117
- https://doi.org/10.1016/j.vlsi.2015.07.008
Abstract
No abstract availableKeywords
Funding Information
- China Scholarship Council (2009102021)
- Natural Science and Engineering Research Council of Canada
This publication has 20 references indexed in Scilit:
- Time-Domain CMOS Temperature Sensors With Dual Delay-Locked Loops for Microprocessor Thermal MonitoringIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011
- A 0.12 mm$^{2}$ 7.4 $\mu$W Micropower Temperature Sensor With an Inaccuracy of $\pm$0.2$^{\circ}$C (3$\sigma$) From $-$30$^{\circ}$C to 125$^{\circ}$CIEEE Journal of Solid-State Circuits, 2011
- All-Digital Time-Domain Smart Temperature Sensor With an Inter-Batch Inaccuracy of $-{\hbox {0.7}} ~^{\circ}{\hbox {C}}-+{\hbox {0.6}}~^{\circ}{\hbox {C}}$ After One-Point CalibrationIEEE Transactions on Circuits and Systems I: Regular Papers, 2010
- A 1.2-V 10-$\mu$W NPN-Based Temperature Sensor in 65-nm CMOS With an Inaccuracy of 0.2 $^{\circ}$C (3$\sigma$) From $-$70 $^{\circ}$C to 125 $^{\circ}$CIEEE Journal of Solid-State Circuits, 2010
- Consistent runtime thermal prediction and control through workload phase detectionPublished by Association for Computing Machinery (ACM) ,2010
- A 1.05 V 1.6 mW, 0.45 $^{\circ}$C 3$\sigma$ Resolution $\Sigma\Delta$ Based Temperature Sensor With Parasitic Resistance Compensation in 32 nm Digital CMOS ProcessIEEE Journal of Solid-State Circuits, 2009
- Proactive temperature management in MPSoCsPublished by Association for Computing Machinery (ACM) ,2008
- Cooling a Microprocessor ChipProceedings of the IEEE, 2006
- Thermal Modeling, Analysis, and Management in VLSI Circuits: Principles and MethodsProceedings of the IEEE, 2006
- Thermal testing on reconfigurable computersIEEE Design & Test of Computers, 2000