Interfacial characteristics and band alignments for ZrO2 gate dielectric on Si passivated p-GaAs substrate
- 10 December 2007
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 91 (24)
- https://doi.org/10.1063/1.2822422
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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