Reliability and performance limitations in SiC power devices
- 1 May 2006
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 46 (5-6), 713-730
- https://doi.org/10.1016/j.microrel.2005.10.013
Abstract
No abstract availableThis publication has 55 references indexed in Scilit:
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