Evaluation of grain-average stress tensor in a tensile-deformed Al–Mn polycrystal by high-energy X-ray diffraction
- 26 July 2017
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 50 (4), 1144-1157
- https://doi.org/10.1107/s1600576717008238
Abstract
Three-dimensional X-ray diffraction was applied to characterize the strain/stress evolution in individual grains of an Al–0.3 wt% Mn polycrystal deformedin situat a synchrotron source. Methodological aspects concerning the calibration of the geometrical setup and the evaluation of the strain/stress tensors are discussed. A two-step calibration method separately treating the detector and the rotation axis allows one to determine the centre-of-mass position and crystallographic orientation of grains with standard errors of about 1.5 µm and 0.02°, respectively. Numerical simulations indicate that the error of normal strain components (about 1 × 10−4) is mainly caused by calibration errors, while the error of shear components (about 0.5 × 10−4) is largely influenced by counting statistics and random spot-centre errors due to detector distortion. The importance of monitoring the beam energy is emphasized.Keywords
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