Single event transient pulsewidth measurements using a variable temporal latch technique
- 20 December 2004
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 51 (6), 3365-3368
- https://doi.org/10.1109/tns.2004.840020
Abstract
A new test structure was designed for measuring the pulsewidths of transients created by SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84MeV-cm/sup 2//mg. The pulsewidths of SETs generated using heavy ions are measured using a variable temporal latch. Our SET's widths at low LETs agree exceptionally well with previous localized beam measurements.Keywords
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