Texture anisotropy in 3-D images
- 1 March 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Image Processing
- Vol. 8 (3), 346-360
- https://doi.org/10.1109/83.748890
Abstract
Two approaches to the characterization of three-dimensional (3-D) textures are presented: one based on gradient vectors and one on generalized co-occurrence matrices. They are investigated with the help of simulated data for their behavior in the presence of noise and for various values of the parameters they depend on. They are also applied to several medical volume images characterized by the presence of microtextures and their potential as diagnostic tools and tools for quantifying and monitoring the progress of various pathologies is discussed. No firm medical conclusions can be drawn as not enough clinical data are available. The gradient based method appears to be more appropriate for the characterization of microtextures. It also shows more consistent behavior as a descriptor of pathologies than the generalized co-occurrence matrix approach.Keywords
This publication has 33 references indexed in Scilit:
- Texture orientation for sorting photos "at a glance"Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Steerable wedge filters for local orientation analysisIEEE Transactions on Image Processing, 1996
- Segmentation of volumetric medical imagery using multiple geodesic-based active surfacesPublished by SPIE-Intl Soc Optical Eng ,1996
- Image registration using multi-scale texture momentsImage and Vision Computing, 1995
- Texture Analysis using Local Property Maps.Published by British Machine Vision Association and Society for Pattern Recognition ,1995
- Identifying High Level Features of Texture PerceptionCVGIP: Graphical Models and Image Processing, 1993
- Sparse, Opaque Three-Dimensional Texture 1. Arborescent PatternsCVGIP: Image Understanding, 1993
- Optimal convolution filters and an algorithm for the detection of wide linear featuresIEE Proceedings I Communications, Speech and Vision, 1993
- A classification scheme for visual defects arising in semiconductor wafer inspectionJournal of Crystal Growth, 1990
- Polarograms: A new tool for image texture analysisPattern Recognition, 1981