Electrical characterization of MOS memory devices containing metallic nanoparticles and a high-k control oxide layer
- 1 July 2007
- journal article
- Published by Elsevier BV in Surface Science
- Vol. 601 (13), 2859-2863
- https://doi.org/10.1016/j.susc.2006.11.064
Abstract
No abstract availableKeywords
Funding Information
- Ministry of National Education and Religious Affairs
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