A methodology to study lateral parasitic transistors in CMOS technologies
- 1 June 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 45 (3), 1385-1389
- https://doi.org/10.1109/23.685211
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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