Saturated patterned excitation microscopy with two-dimensional excitation patterns
- 1 October 2003
- journal article
- Published by Elsevier BV in Micron
- Vol. 34 (6-7), 283-291
- https://doi.org/10.1016/s0968-4328(03)00053-2
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
- Resolution enhancement by subtraction of confocal signals taken at different pinhole sizesMicron, 2003
- Saturated patterned excitation microscopy—a concept for optical resolution improvementJournal of the Optical Society of America A, 2002
- A dual path programmable array microscope (PAM): simultaneous acquisition of conjugate and non‐conjugate imagesJournal of Microscopy, 2001
- Three-dimensional resolution enhancement in fluorescence microscopy by harmonic excitationOptics Letters, 2001
- True optical resolution beyond the Rayleigh limit achieved by standing wave illuminationProceedings of the National Academy of Sciences of the United States of America, 2000
- Doubling the lateral resolution of wide-field fluorescence microscopy using structured illuminationPublished by SPIE-Intl Soc Optical Eng ,2000
- Surpassing the lateral resolution limit by a factor of two using structured illumination microscopyJournal of Microscopy, 2000
- Equivalence of the Huygens–Fresnel and Debye approach for the calculation of high aperture point‐spread functions in the presence of refractive index mismatchJournal of Microscopy, 1999
- Laterally modulated excitation microscopy: improvement of resolution by using a diffraction gratingPublished by SPIE-Intl Soc Optical Eng ,1999
- Information capacity and resolution in an optical systemJournal of the Optical Society of America A, 1986