Particle induced X-ray emission (PIXE) analyses on metal samples with structured surfaces
- 1 January 1984
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 1 (1), 41-44
- https://doi.org/10.1016/0168-583x(84)90476-2
Abstract
No abstract availableKeywords
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