Comprehensive SEE characterization of 0.13µm flash-based FPGAs by heavy ion beam test
- 1 September 2007
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Heavy-ion test results utilizing novel test methodologies of reprogrammable and non-volatile flash-based FPGAs are presented and discussed. The 5 programmable architectures in the A3P FPGA-family were tested: I/O structures, FPGA Core, PLL, FROM and SRAM.Keywords
This publication has 4 references indexed in Scilit:
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