Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction
- 1 February 2015
- journal article
- Published by Elsevier BV in Neurocomputing
- Vol. 149, 1206-1215
- https://doi.org/10.1016/j.neucom.2014.09.007
Abstract
No abstract availableFunding Information
- National Natural Science Foundation of China (61272028, 61473317, 61273274, 61104078)
- Fundamental Research Funds for the Central Universities of China (2013JBZ003)
- Specialized Research Fund for the Doctoral Program of Higher Education of China (20120009110008)
- Program for New Century Excellent Talents in University (NCET-12-0768)
- National Key Technology R&D Program of China (2012BAH01F03)
- National Basic Research (973) Program of China (2011CB302203)
- The National High Technology Research and Development Program (863) of China (2014AA015202)
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