Defect detection in textile fabric images using wavelet transforms and independent component analysis
- 1 January 2006
- journal article
- Published by Pleiades Publishing Ltd in Pattern Recognition and Image Analysis
- Vol. 16 (1), 61-64
- https://doi.org/10.1134/s1054661806010196
Abstract
—In this paper, a new method based on the use of wavelet transformation prior to independent component analysis for solving the problem of defect detection in textile fabric images is presented. Different subbands of the wavelet packet tree scheme of the defect-free subwindows are obtained and independent components of these subbands are calculated as basis vectors. The true feature vectors corresponding to these basis vectors are computed. The test subwindow is labeled as defective, or not according to the Euclidean distance between the true feature vector representing the non-defective regions and the feature vector of the subwindow under test. The advantage of adding wavelet analysis prior to the independent component analysis is presented. DOI: 10.1134/S1054661806010196 1Keywords
This publication has 3 references indexed in Scilit:
- Independent component analysis: algorithms and applicationsNeural Networks, 2000
- An efficient method for texture defect detection: sub-band domain co-occurrence matricesImage and Vision Computing, 2000
- Texture analysis and classification with tree-structured wavelet transformIEEE Transactions on Image Processing, 1993