Force microscope using a fiber-optic displacement sensor
- 1 November 1988
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (11), 2337-2340
- https://doi.org/10.1063/1.1139958
Abstract
A force microscope is described which uses a fiber-optic interferometer as the cantilever displacement sensor. Low thermal drift and reduced susceptibility to laser frequency variation are achieved due to the small (several micrometer) size of the interferometer cavity. A sensitivity of 1.7×10−4 Å/(Hz)1/2 is observed for frequencies above 2 kHz. The drift rate of the sensor is on the order of 3 Å/min. As an initial demonstration, laser-written magnetic domains in a thin film sample of TbFeCo were imaged.Keywords
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