Atomic resolution imaging of a nonconductor by atomic force microscopy
- 1 October 1987
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 62 (7), 2599-2602
- https://doi.org/10.1063/1.339435
Abstract
We have demonstrated the capability of the atomic force microscope to image the surface of an electrically insulating solid with atomic resolution. Images of highly oriented pyrolytic boron nitride taken in air show atomic corrugations with a lateral resolution better than 3 Å. Low-noise images of graphite and molybdenum disulfide are also presented.Keywords
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