Fast atom bombardment mass spectrometry for applied surface analysis
- 1 August 1982
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 4 (4), 160-167
- https://doi.org/10.1002/sia.740040407
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Fast atom bombardment of solids as an ion source in mass spectrometryNature, 1981
- Fast atom bombardment quadrupole mass spectrometryJournal of the Chemical Society, Chemical Communications, 1981
- Fast atom bombardment of solids (F.A.B.): a new ion source for mass spectrometryJournal of the Chemical Society, Chemical Communications, 1981
- The surface composition of dealuminated zeolitesJournal of the Chemical Society, Chemical Communications, 1981
- Electron beam effects in Auger electron spectroscopy and scanning electron microscopySurface and Interface Analysis, 1979
- Thickness measurements on layered materials in powder form by means of XPS and ion sputteringSurface and Interface Analysis, 1979
- Test of a quantitative approach to secondary ion mass spectrometry on glass and silicate standardsAnalytical Chemistry, 1977
- Studies of the surface behavior of oxide catalysts by secondary ion mass spectrometry (SIMS) 1. The surface composition of copper-containing spinel catalysts and their precursorsJournal of Catalysis, 1976
- Secondary ion mass spectrometry (SIMS): A technique for studying surface reactivityPublished by Royal Society of Chemistry (RSC) ,1976
- Use of an Electron Flood Gun to Reduce Surface Charging in X-Ray Photoelectron SpectroscopyApplied Physics Letters, 1972