A study of trap-limited conduction influenced by plasma damage on the source/drain regions of amorphous InGaZnO TFTs
- 8 October 2015
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 48 (44)
- https://doi.org/10.1088/0022-3727/48/44/445104
Abstract
No abstract availableFunding Information
- Ministry of Science and Technology (MOST 104-2221-E-224-050)
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