Transient capacitance spectroscopy of defect levels in CIGS devices
- 1 February 2000
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 361-362, 371-377
- https://doi.org/10.1016/s0040-6090(99)00822-6
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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