Review on Complete Mueller Matrix Optical Scanning Microscopy Imaging
Open Access
- 11 February 2021
- journal article
- review article
- Published by MDPI AG in Applied Sciences
- Vol. 11 (4), 1632
- https://doi.org/10.3390/app11041632
Abstract
Optical scanning microscopy techniques based on the polarization control of the light have the capability of providing non invasive label-free contrast. By comparing the polarization states of the excitation light with its transformation after interaction with the sample, the full optical properties can be summarized in a single Mueller matrix. The main challenge of such a technique is to encode and decode the polarized light in an optimal way pixel-by-pixel and take into account the polarimetric artifacts from the optical devices composing the instrument in a rigorous calibration step. In this review, we describe the different approaches for implementing such a technique into an optical scanning microscope, that requires a high speed rate polarization control. Thus, we explore the recent advances in term of technology from the industrial to the medical applications.
Keywords
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