Electronic properties of the Cu2ZnSn(Se,S)4 absorber layer in solar cells as revealed by admittance spectroscopy and related methods
- 18 June 2012
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 100 (25), 253905
- https://doi.org/10.1063/1.4729751
Abstract
Admittance spectra and drive-level-capacitance profiles of several high performance Cu2ZnSn(Se,S)4 (CZTSSe) solar cells with bandgap ∼1.0–1.5 eV are reported. In contrast to the case for Cu(In,Ga)(S,Se)2, the CZTSSe capacitance spectra exhibit a dielectric freeze out to the geometric capacitance plateau at moderately low frequencies and intermediate temperatures (120–200 K). These spectra reveal important information regarding the bulk properties of the CZTSSe films, such as the dielectric constant and a dominant acceptor with energy level of 0.13–0.2 eV depending on the bandgap. This deep acceptor leads to a carrier freeze out effect that quenches the CZTSSe fill factor and efficiency at low temperatures.This publication has 17 references indexed in Scilit:
- Deep defects in Cu2ZnSnS4 monograin solar cellsEnergy Procedia, 2011
- Device characteristics of a 10.1% hydrazine‐processed Cu2ZnSn(Se,S)4 solar cellProgress in Photovoltaics: Research and Applications, 2011
- The path towards a high-performance solution-processed kesterite solar cellSolar Energy Materials and Solar Cells, 2011
- New world record efficiency for Cu(In,Ga)Se2 thin‐film solar cells beyond 20%Progress in Photovoltaics: Research and Applications, 2011
- Photovoltaic Devices: High‐Efficiency Solar Cell with Earth‐Abundant Liquid‐Processed Absorber (Adv. Mater. 20/2010)Advanced Materials, 2010
- Electronic and optical properties of Cu2ZnSnS4 and Cu2ZnSnSe4Journal of Applied Physics, 2010
- Interpretation of admittance, capacitance-voltage, and current-voltage signatures in Cu(In,Ga)Se2 thin film solar cellsJournal of Applied Physics, 2010
- The determination of carrier mobilities in CIGS photovoltaic devices using high-frequency admittance measurementsThin Solid Films, 2005
- Self-compensation of intrinsic defects in the ternary semiconductorPhysical Review B, 2004
- Diode quality factor determination for thin-film solar cellsSolar Cells, 1989