Threshold reduction by rapid thermal annealing in MBE-grown AlInGaAs multiquantum well lasers on GaAs
- 1 January 1996
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 32 (4), 351-352
- https://doi.org/10.1049/el:19960216
Abstract
The authors report a significant improvement in laser performance in AlInGaAs multiquantum well lasers using rapid thermal annealing (RTA). They observe that threshold current densities can be reduced by up to a factor of 5 with post-growth rapid thermal annealing for AlInGaAs/AlGaAs quantum well lasers. A record low threshold current density of 118 A/cm2 per well was achieved in 835 nm strained AlInGaAs doublequantum well (DQW) lasers grown by solid source molecular beam epitaxy (MBE).Keywords
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