Random telegraph noise of deep-submicrometer MOSFETs
- 1 February 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 11 (2), 90-92
- https://doi.org/10.1109/55.46938
Abstract
The random telegraph noise exhibited by deep-submicrometer MOSFETs with very small channel area (Keywords
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