XRD, XPS, optical and electrical studies on the conversion of SnS thin films to SnO2
- 1 February 1994
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 239 (1), 85-92
- https://doi.org/10.1016/0040-6090(94)90112-0
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- SnS-Sno2 conversion of chemically deposited SnS thin filmsAdvanced Materials for Optics and Electronics, 1992
- Low Temperature Chemical Precipitation and Vapor Deposition of Sn x S Thin FilmsJournal of the Electrochemical Society, 1987
- Preparation and characterization of chemically deposited tin(II) sulphide thin filmsThin Solid Films, 1987
- Annealing effect of SnO2 films prepared by chemical vapor deposition: Evidence of chlorine removal by auger electron spectroscopy and rutherford back-scattering spectrometry studiesSolar Cells, 1985
- Influence of annealing on the phase composition, transmission and resistivity of SnOx thin filmsThin Solid Films, 1984
- Transparent heat-reflecting coatings for solar applications based on highly doped tin oxide and indium oxideSolar Energy Materials, 1983
- Characterization of Al-AlOx and Sn-SnOx cermet films deposited by reactive evaporationThin Solid Films, 1983
- Refinement of the structures of GeS, GeSe, SnS and SnSeZeitschrift für Kristallographie, 1978
- Theoretical Considerations Governing the Choice of the Optimum Semiconductor for Photovoltaic Solar Energy ConversionJournal of Applied Physics, 1956
- Silicon Solar Energy ConvertersJournal of Applied Physics, 1955