Angle-resolved photoemission studies of the band structure of TiSe2and TiS2

Abstract
The electronic structure of high-quality TiSe2 and TiS2 crystals has been investigated using angle-resolved photoemission with HeI, HeII, and NeI resonance radiation. Results compare well with recent self-consistent energy-band calculations although differences occur which may be due to the three- rather than two-dimensional nature of specific bands. Occupied d states at the zone edge are observed in both materials. A small overlap with the sp valence band at Γ is observed in the case of TiSe2 in approximate agreement with other workers. TiS2 appears to be a defect semiconductor with a band gap of 0.3 ± 0.2 eV.