Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution
- 18 May 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 50 (20), 1455-1457
- https://doi.org/10.1063/1.97800
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Polarized Electron Probes of Magnetic SurfacesScience, 1986
- Magnetic domain imaging with a scanning Kerr effect microscopeIEEE Transactions on Magnetics, 1986
- Magneto-optic determination of magnetic recording head fieldsIEEE Transactions on Magnetics, 1986
- Lorentz microscopy of micron-sized laser-written magnetic domains in TbFeApplied Physics Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Magneto-optic observation of Bloch linesJournal of Applied Physics, 1984