Electron optical techniques for microstructural andcompositional analysis of thin films
- 1 January 1990
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 193-194, 418-430
- https://doi.org/10.1016/s0040-6090(05)80052-5
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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