Internal photoemission measurements on a - Si1−xGex : H/c - Si heterojunctions
- 1 December 1989
- journal article
- Published by Elsevier BV in Journal of Non-Crystalline Solids
- Vol. 114, 555-557
- https://doi.org/10.1016/0022-3093(89)90648-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Energy-band discontinuities in a heterojunction of amorphous hydrogenated Si and crystalline Si measured by internal photoemissionApplied Physics Letters, 1987
- Study of the band discontinuities at the a-SiH/c-Si interface by internal photoemissionJournal of Non-Crystalline Solids, 1985
- Optoelectrical properties of amorphous-crystalline silicon heterojunctionsApplied Physics Letters, 1984
- Junctions Between Amorphous and Crystalline SiliconPhysica Scripta, 1981