Impurity and defect distribution in ZnTe/GaAs epilayers of different thickness
- 2 February 1992
- journal article
- Published by Elsevier BV in Journal of Crystal Growth
- Vol. 117 (1-4), 290-296
- https://doi.org/10.1016/0022-0248(92)90762-8
Abstract
No abstract availableKeywords
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