Lateral interband tunneling transistor in silicon-on-insulator
- 8 March 2004
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 84 (10), 1780-1782
- https://doi.org/10.1063/1.1668321
Abstract
We report on a lateral interband tunnelingtransistor, where the source and drain form a heavily doped lateral pn junction in a thin Si film on a silicon-on-insulator (SOI) substrate. The transistor action results from the control of the reverse-bias tunneling breakdown under drain bias V D by a gate voltage V G . We observe gate control over tunneling drain current I D at both polarities of V G with negligible gate leakage. Systematic I D (V G ,V D ) measurements, together with numerical device simulations, show that in first approximation I D depends on the maximum junction electric field F max (V G ,V D ). Excellent performance is hence predicted in devices with more abrupt junctions and thinner SOI films. The device does not have an inversion channel and is not subject to scaling rules of standard Si transistors.Keywords
This publication has 18 references indexed in Scilit:
- Ultrathin silicon-on-insulator vertical tunneling transistorApplied Physics Letters, 2003
- Ultimately thin double-gate SOI MOSFETsIEEE Transactions on Electron Devices, 2003
- Performance Improvement in Vertical Surface Tunneling Transistors by a Boron Surface PhaseJapanese Journal of Applied Physics, 2001
- Fabrication of Self-Aligned Surface Tunnel Transistors with a 80-nm Gate LengthJapanese Journal of Applied Physics, 2000
- Highly suppressed short-channel effects in ultrathin SOI n-MOSFETsIEEE Transactions on Electron Devices, 2000
- Negative differential conductance in three-terminal silicon tunneling deviceApplied Physics Letters, 1996
- An indirect interband tunneling formulation for an arbitrary electric field direction in semiconductorsSolid-State Electronics, 1995
- First Observation of Negative Differential Resistance in Surface Tunnel TransistorsJapanese Journal of Applied Physics, 1994
- Characterization of Depletion-Type Surface Tunnel TransistorsJapanese Journal of Applied Physics, 1992
- New Phenomenon in Narrow GermaniumJunctionsPhysical Review B, 1958