Observation of Capillary Waves on Liquid Thin Films from Mesoscopic to Atomic Length Scales

Abstract

The surfaces of liquid thin perfluorohexane, cyclohexane, decane, and ethanol films adsorbed on silicon wafers have been investigated by means of x-ray reflectivity, diffuse scattering, and grazing incidence diffraction. The measurements prove that the surface structure of the wetting films can be described by a universal height-height correlation function derived from a capillary wave model with the surface tension and particular cutoffs as parameters. The data favor a reduced capillary wave surface tension as predicted by exact theories, over an enhanced capillary wave surface tension, as suggested by simple mode-coupling models.